Full-Wave Broadband Characterization of On-Chip Passives Subject to Etching Effects Using a Vectorial Unified Transform for Polyhedral Geometries
This paper presents a generalized formulation of the differential surface admittance (DSA) operator for three-dimensional electromagnetic analysis of arbitrary polyhedral geometries. Motivated by the increasing need for accurate signal integrity modeling in high-frequency integrated circuits and printed circuit boards, the proposed approach enables efficient characterization of intricate passive interconnect structures. Therefore, a novel vectorial unified […]