Our
Publications
As any academic research lab, we publish our work in high-impact journals and as conference contributions. This way, we aim to disseminate research and findings to a broad audience, trigger interaction and collaboration, and advance science and technology.
A complete overview of all our publications can be found via the database of Ghent University. Our most recent work is presented below.
Recent publications
Fokas Based Dirichlet-to-Neumann Operators for Accurate Signal Integrity Assessment of Interconnects
In this contribution, we present a new approach to fully characterize interconnects composed out of arbitrary polygonal cross-sections and containing piecewise homogeneous material parameters. The complex per-unit-of-length inductance and capacitance matrices are obtained through the application of pertinent Dirichlet-to-Neumann operators,
Solving the Fully Coupled Time-Dependent Maxwell-Dirac System: A Second-Order Accurate Numerical Scheme
Owing to their increased carrier velocities, Dirac materials have become a promising option for the integration into nanoelectronics. However, without the aid of simulation software that is able to accurately describe the behavior of these materials, the fabrication of novel
An ADHIE-TDDFT Method for the EM/QM Co-simulation of Coupled 1-D Nanowires
Over the past years, the rapid increase in device functionality and miniaturization has stimulated the demand for novel topologies and materials. One such trend is the emergence of one-dimensional nanostructures in electronic components. Given the embryonic stage of these applications,
Efficient Characterization of Interconnects with Arbitrary Polygonal Cross-sections using Fokas-derived Dirichlet-to-Neumann Operators
A novel technique to accurately characterize interconnects with general, piecewise homogeneous material parameters and arbitrary polygonal cross-sections is presented. To compute the per-unit-of-length complex inductance and capacitance matrices of the considered structures, we apply a boundary integral equation framework, invoking
Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness
In this contribution we study the propagation constant of interconnects subject to line edge roughness by means of an efficient stochastic framework. By employing the stochastic testing method, we succeed in limiting the number of calls to the full-wave electromagnetic
Authors’ Online Seminar – IEEE Journal on Multiscale and Multiphysics Computational Techniques
This seminar is based on the paper “A Hybrid EM/QM Framework Based on the ADHIE-FDTD Method for the Modeling of Nanowires“, IEEE J-MMCT, vol. 7, 2022, pp. 236-251, coauthored by Pieter Decleer and Dries Vande Ginste. The paper won the